Efficient Guided-Probe Fault Location Method for Sequential Circuits

摘要

The efficiency of a guided-probe fault location process is affected by the number of the probed lines. This number depends on the size of the target area and the method by which a line is selected for probing. This paper presents a method for reducing the size of the target area in a sequential circuit by introducing the concepts of Type-Ⅰ and Type-Ⅱ faults. This paper also presents a method of selecting lines for probing in a more efficient way. The efficiency of the proposed methods is demonstrated by experimental results.