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A Secure Data-Toggling SRAM for Confidential Data Protection

机译:用于机密数据保护的安全数据触发SRAM

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We study the security feature of static random access memory (SRAM) against the data imprinting attack and provide a solution to protect the SRAM from this attack. There are four main contributions in this paper. First, the negative-bias temperature-instability (NBTI) degradation of PMOS transistors in the conventional SRAM cell that causes the data imprinting effect is explained. Second, the data imprinting effect that leaks the stored information in the conventional SRAM cell is investigated. Third, a novel low transistor-count transmission-gate-based master-slave SRAM cell is proposed to periodically toggle the stored data for reducing the data imprinting effect. Fourth, an efficient imprinting analysis flow is proposed to evaluate the proposed data-toggling SRAM for quantifying the data imprinting effect. Based on a 65-nm CMOS process, we implement and prototype the proposed 1k-byte data-toggling SRAM design. We perform our imprinting analysis flow on various SRAM ICs and benchmark our proposed data-toggling SRAM IC against the non-toggling SRAM IC and a commercial Lyontek SRAM IC. From the measurement results, the non-toggling SRAM and Lyontek SRAM suffer from 60 & x0025; and 81 & x0025; data imprinting effects, respectively, whereas our data-toggling SRAM has only 11 & x0025; data imprinting effect (at 160-kHz toggling frequency). The data-toggling SRAM could switch between high security (& x003C; 5 & x0025; data imprinting effect) high power mode for hardware security applications and low power (& x003C; 0.1mW) low security mode for power-saving applications. Particularly, our data-toggling SRAM could feature as low as & x007E;1 & x0025; data imprinting effect when increasing the toggling frequency to 1.6 MHz by compromising the power dissipation. Using the image analysis flow, the stored information is revealed in both the non-toggling and Lyontek SRAM ICs but is well protected in the proposed data-toggling SRAM IC.
机译:我们研究了静态随机存取存储器(SRAM)抵御数据烙印攻击的安全性,并提供了一种保护SRAM免受这种攻击的解决方案。本文有四个主要贡献。首先,说明引起数据刻印效果的常规SRAM单元中的PMOS晶体管的负偏压温度不稳定性(NBTI)劣化。其次,研究了泄漏传统SRAM单元中存储的信息的数据压印效果。第三,提出一种新颖的基于低晶体管数的基于传输门的主从SRAM单元,以周期性地切换存储的数据,以降低数据压印效果。第四,提出了一种有效的刻印分析流程来评估所提出的数据触发SRAM,以量化数据刻印效果。基于65纳米CMOS工艺,我们实现了拟议的1k字节数据触发SRAM设计并进行了原型设计。我们在各种SRAM IC上执行印记分析流程,并针对非触发SRAM IC和商用Lyontek SRAM IC对我们提出的数据触发SRAM IC进行基准测试。从测量结果来看,非触发式SRAM和Lyontek SRAM遭受60&x0025;和81&x0025;数据压印效果,而我们的数据触发SRAM只有11&x0025;数据打印效果(在160kHz触发频率下)。触发数据的SRAM可以在硬件安全应用的高安全性(&x003C; 5&x0025;数据打印效果)高功率模式与节能应用的低功率(&x003C; 0.1mW)低安全模式之间切换。特别是,我们的数据触发型SRAM的功能可能低至&x007E; 1&x0025;。通过降低功耗将切换频率提高到1.6 MHz时,数据刻印效果。使用图像分析流程,存储的信息可以在非触发式和Lyontek SRAM IC中显示出来,但是在建议的数据触发SRAM IC中得到了很好的保护。

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