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Coupled drift-diffusion/quantum transmitting boundary method simulations of thin oxide devices with specific application to a silicon based tunnel switch diode

机译:薄氧化物器件的漂移-扩散/量子传输边界耦合方法模拟,特别应用于基于硅的隧道开关二极管

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摘要

We present a method of coupling drift-diffusion simulations with quantum transmitting boundary method (QTBM) tunnel current calculations. This allows self-consistent simulation of thin oxide devices in which large tunnel currents can flow. Simulated results are presented for a thin oxide Al/SiO/sub 2//Si structure and an Al/SiO/sub 2/-Si/p-Si tunnel switching diode. We demonstrate the careful use of the recombination lifetime as an adjustable or relaxable parameter in order to obtain converging solutions.
机译:我们提出了一种将漂移扩散模拟与量子传输边界方法(QTBM)隧道电流计算耦合的方法。这允许对其中可以流过大隧道电流的薄氧化物器件进行自洽的仿真。给出了薄氧化物Al / SiO / sub 2 // Si结构和Al / SiO / sub 2 // n-Si / p-Si隧道开关二极管的模拟结果。我们展示了重组寿命作为可调整或可松弛参数的谨慎使用,以获得收敛解。

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