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Unipolar Resistive Switch Based on Silicon Monoxide Realized by CMOS Technology

机译:CMOS技术实现的基于一氧化硅的单极电阻开关

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摘要

In this letter, a reliable nonvolatile resistive switching device based on silicon monoxide (SiO) is demonstrated. The device was fabricated with a low-temperature process that can be compatible with a CMOS back-end process and attractive for 3-D memory integration. The fabricated Cu/SiO/W device was found to have a repeatable unipolar resistive switching behavior. The results show excellent on/off resistance ratio (over 104) and good retention performance. The switching mechanism of the device is analyzed by experimental data and probably can be attributed to the behaviors of copper ions in the bulk of SiO under different voltages.
机译:在这封信中,展示了一种可靠的基于一氧化硅(SiO)的非易失性电阻式开关器件。该器件采用低温工艺制造,该工艺可以与CMOS后端工艺兼容,并且对3-D存储器集成具有吸引力。发现所制造的Cu / SiO / W器件具有可重复的单极电阻切换行为。结果显示出优异的开/关电阻比(超过104)和良好的保持性能。通过实验数据分析了该器件的开关机理,并且可能归因于不同电压下大量SiO中铜离子的行为。

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