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Warpage behavior analysis in package processes of embedded copper substrates

机译:嵌入式铜基板包装过程中的翘曲行为分析

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With the advance of the semiconductor industry and in response to the demands of ultra-thin products, packaging technology has been continuously developed. Thermal bonding process of copper pillar flip chip packages is a new bonding process in packaging technology, especially for substrates with embedded copper trace. During the packaging process, the substrate usually warps because of the heating process. In this paper, a finite element software ANSYS is used to model the embedded copper trace substrate and simulate the thermal and deformation behaviors of the substrate during the heating package process. A fixed geometric configuration equivalent to the real structure is duplicated to make the simulation of the warpage behavior of the substrate feasible. An empirical formula for predicting the warpage displacements is also established.
机译:随着半导体行业的前进,响应超薄产品的需求,包装技术已不断发展。铜柱倒装芯片封装的热粘结过程是包装技术的新粘接过程,特别是对于具有嵌入式铜迹线的基材。在包装过程中,基板通常由于加热过程而扭曲。本文使用有限元软件ANSYS用于建模嵌入式铜迹线基板,并在加热封装过程中模拟基板的热和变形行为。复制与实际结构等同的固定几何配置被复制以使基板的翘曲行为进行仿真。还建立了预测翘曲位移的实证公式。

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