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首页> 外文期刊>International Journal of Engineering Science and Technology >A LOW NOISE, HIGH-SPEED COMPENSATED CMOS OP-AMP DESIGN TECHNIQUE
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A LOW NOISE, HIGH-SPEED COMPENSATED CMOS OP-AMP DESIGN TECHNIQUE

机译:低噪声,高速补偿CMOS OP-AMP设计技术

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In this paper, we have proposed a new methodology for the design of low frequency, low noise and high speed compensated CMOS op-amp which specifies open loop circuit parameters to obtain enhanced gain, settling time and closed loop stability. The op-amp which we have designed consists of an Operational Transconductance Amplifier (OTA) followed by an output buffer. The OTA design involves the use of a continuous-time Common mode feedback circuit which maintains the output common voltage at the required level while maximizing the output swing and the desired compensation is done with a capacitor connected between the input and output of the buffer. The low noise high speed Op-Amp is designed using 180nm CMOS technology and exhibits 88 dB DC gain. For a parallel combination of 2 pF and 1 k? load, the unity gain frequency and phase margin are found to be 251 MHz and 37o respectively. Under the same load condition, the proposed compensation method results in a roughly 1.8 times increase in unity gain frequency i.e 392 MHz and a 33o improvement in the phase margin as compared to the conventional approach.
机译:在本文中,我们提出了一种新的方法,用于设计低频,低噪声和高速补偿CMOS OP-AMP,指定开环电路参数,以获得增强的增益,稳定时间和闭环稳定性。我们设计的OP-AMP包括操作跨导放大器(OTA),后跟输出缓冲区。 OTA设计涉及使用连续时间公共模式反馈电路,该反馈电路在所需水平下保持输出公共电压,同时最大化输出摆动,并且使用连接在缓冲器的输入和输出之间的电容器进行期望的补偿。低噪声高速OP-AMP使用180nm CMOS技术设计,展示88 dB DC增益。对于2 pf和1k的并联组合?负载,指标增益频率和相位余量分别为251 MHz和37O。在相同的负载条件下,与传统方法相比,所提出的补偿方法的1/4MHz的增加大约为1.8倍,并且相对于相位余量的33o改善。

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