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Fractional Unit Root Tests Allowing for a Structural Change in Trend under Both the Null and Alternative Hypotheses

机译:分数单位根检验允许零假设和替代假设下趋势的结构变化

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This paper considers testing procedures for the null hypothesis of a unit root process against the alternative of a fractional process, called a fractional unit root test. We extend the Lagrange Multiplier (LM) tests of Robinson (1994) and Tanaka (1999), which are locally best invariant and uniformly most powerful, to allow for a slope change in trend with or without a concurrent level shift under both the null and alternative hypotheses. We show that the limit distribution of the proposed LM tests is standard normal. Finite sample simulation experiments show that the tests have good size and power. As an empirical analysis, we apply the tests to the Consumer Price Indices of the G7 countries.
机译:本文考虑了针对单位根过程的零假设与分数过程的替代方法(称为分数单位根检验)的测试程序。我们扩展了Robinson(1994)和Tanaka(1999)的拉格朗日乘数(LM)检验,这些检验是局部最佳不变的,并且一致地是最有效的,以允许在没有零点和零点同时出现水平偏移的情况下趋势的斜率变化。替代假设。我们表明,提出的LM测试的极限分布是标准正态分布。有限的样本仿真实验表明,这些测试具有良好的大小和功效。作为一项经验分析,我们将这些检验应用于G7国家的消费者物价指数。

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