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Studying of Thickness Effects on the Optical and Structural Properties of ZnO/Ag/ZnO Multilayer Thin Films by Using Surface Plasmon Resonance

机译:利用表面等离子体共振研究厚度对ZnO / Ag / ZnO多层薄膜光学和结构性能的影响

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In this paper, the Effect of Surface Plasmon's on Optical and structure Properties of Multilayer ZnO/Ag/ZnO thin film have been investigated. These properties could be tuned using the plasmonic properties of the two layers of ZnO. The two thin layers of ZnO with thicknesses varying from 30 nm to 40 nm and the intermediate Ag layer of 6 nm thickness have been deposited using radio frequency magnetron sputtering and Vacuum Deposition technique on glass substrate respectively. multilayered ZnO/Ag/ZnO thin films with c -axis-oriented wurtzite structure is obtained at a growth temperature 300 ? C. X-ray diffraction shows that the full width at half maximum θ -2θ of (002) ZnO/Ag/ZnO is located at approximately 34.28 ? . UV-VIS Spectrometer has been used to measure the optical transparency. We also studied the influence of ZnO thickness on optical properties of the ZnO/Ag/ZnO composite and the effect mechanism by surface plasmon.
机译:本文研究了表面等离子体对多层ZnO / Ag / ZnO薄膜光学和结构性质的影响。可以使用两层ZnO的等离激元性质来调节这些性质。分别使用射频磁控溅射和真空沉积技术在玻璃基板上沉积了厚度从30 nm到40 nm的两层ZnO薄层和6 nm厚度的中间Ag层。在300℃的生长温度下得到c轴取向纤锌矿结构的多层ZnO / Ag / ZnO薄膜。 X射线衍射表明,(002)ZnO / Ag / ZnO的半最大θ-2θ的全宽度位于约34.28Ω。 。 UV-VIS光谱仪已用于测量光学透明度。我们还研究了ZnO厚度对ZnO / Ag / ZnO复合材料光学性能的影响以及表面等离激元的影响机理。

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