CORRELATION INDICATORS OF MICROCHANGES IN TECHNICAL STATES OF CONTROL OBJECTS

摘要

The paper shows that due to the dynamics and varied characteristics of signals received from output sensors, there are some difficulties in indicating the initial period of changing the technical conditions of objects. Technologies are proposed to estimate correlated noise indicators, which provide a reliable reaction to incipient defects. This effect is achieved due to the excess-frequency analysis, which allows extracting additional information from both a useful signal and noise.