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Position-Binary and Spectral Indicators of Microchanges in the Technical States of Control Objects

机译:控制对象技术状态中微电量的位置二元和光谱指标

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摘要

It is shown that, at the early stage of the change in the technical state of an object, the measurement information is partially lost because of the dynamics of the changes in the characteristics of the signals at the output of the corresponding sensors. When the traditional technique is used, this can be found only if the process is pronounced; for this reason, sometimes it is impossible to prevent accidents that can have disastrous effects. The proposed techniques for determination of the estimates of the position-binary and spectral noise indicators reflect with high accuracy the beginning of any micro-change in the control objects with the use of excess-frequency analysis by extraction of additional information from both the desired signal and the noise.
机译:结果表明,在对象的技术状态的改变的早期阶段,由于在相应传感器的输出处的信号的特性的变化的动态,测量信息部分地丢失。 当使用传统技术时,只有在该过程发音时才可以找到; 因此,有时无法预防可能具有灾难性影响的事故。 所提出的技术,用于确定位置二进制和光谱噪声指示器的估计的估计反映了通过从所需信号提取附加信息的附加信息,使用过度分析来高精度地反映了控制对象中的任何微观变化的开始 和噪音。

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