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Very large-bandgap insulating monolayers of ODS on SiC

机译:SiC上ODS的超宽带隙绝缘单层

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In the present work we describe the electronic properties of octadecylsiloxane (ODS) adsorbed on 6H-SiC(0001). A quantitative analysis of the C1 s region of the functionalized samples by X-ray photoelectron spectroscopy (XPS) revealed a surface coverage of about one monolayer. The highest occupied molecular orbital (HOMO) of the organic film is located about E_b = -5.3eV below the Fermi level as determined by ultraviolet photoemission spectroscopy (UPS). Inverse photoemission (IPE) determined the energetic position of the lowest unoccupied molecular orbital (LUMO) about E_u = 3.7 eV above the Fermi level. Thus the HOMO-LUMO energy gap is determined to about 9 eV for the present system. A comparison between the respective electronic states of the substrate and the adsorbate revealed barrier heights for charge transport from the substrate into the adsorbate, 3.3 eV and 2.7 eV for electrons and holes, respectively. The time evolution of the collected IPE spectra indicates that the LUMO is mainly attributed to antibonding σ_(Si-C)* bonds.
机译:在本工作中,我们描述了吸附在6H-SiC(0001)上的十八烷基硅氧烷(ODS)的电子性能。通过X射线光电子能谱(XPS)对功能化样品的C1s区域进行定量分析,发现其表面覆盖率约为一个单层。如通过紫外光发射光谱法(UPS)所确定的,有机膜的最高占据分子轨道(HOMO)位于费米能级以下约E_b = -5.3eV。反向光发射(IPE)确定了费米能级以上E_u = 3.7 eV的最低未占据分子轨道(LUMO)的能量位置。因此,对于本系统,HOMO-LUMO能隙被确定为约9eV。衬底和被吸附物的各自电子状态之间的比较表明,电荷从衬底传输到被吸附物中的势垒高度分别为电子和空穴的3.3 eV和2.7 eV。收集到的IPE光谱的时间演变表明,LUMO主要归因于抗键σ_(Si-C)*键。

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