Ultrafast pulse characterization using cross phase modulation in silicon

摘要

Based on the high nonlinearity of the chip-scale silicon waveguide with small dispersion, a compact frequency-resolved optical gating system has been demonstrated using cross phase modulation for ultrafast pulse characterization. The principal component generalized projections algorithm is used to retrieve the amplitude and phase from the spectrogram. Amplitude and phase of a 540 fs pulse have been measured. The measured amplitude result is confirmed by the autocorrelation measurement.