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Anomalous dielectric peak in Mg and Li doped ZnO ceramics and thin films

机译:Mg和Li掺杂的ZnO陶瓷和薄膜中的异常介电峰

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摘要

In this manuscript we report dielectric measurements of Mg and hi. doped ZnO ceramics and thin films of various compositions. We have tried to reproduce the reported ferroelectriclike behavior in doped ZnO ceramics and thin films and observed anomalous dielectric peak in our samples at temperatures similar to the reported data. However, this peak disappeared when the same samples were measured in vacuum. Our results suggest that previously reported anomalous dielectric peak in doped ZnO samples is not related to the ferroelectric phase transition and is a measurement artifact originated from the presence of water vapor in the measurement system.
机译:在此手稿中,我们报告了Mg和hi的介电测量。掺杂的ZnO陶瓷和各种组成的薄膜。我们试图重现所报告的掺杂ZnO陶瓷和薄膜中类似铁电的行为,并在与所报告数据相似的温度下观察到我们样品中的异常介电峰。但是,当在真空中测量相同的样品时,该峰消失。我们的结果表明,先前报道的掺杂ZnO样品中异常的介电峰与铁电相变无关,并且是由于测量系统中水蒸气的存在而引起的测量伪影。

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  • 来源
    《Applied Physics Letters》 |2010年第19期|p.192903.1-192903.3|共3页
  • 作者单位

    Ceramics Laboratory, EPFL-Swiss Federal Institute of Technology, CH-1015 Lausanne, Switzerland;

    Ceramics Laboratory, EPFL-Swiss Federal Institute of Technology, CH-1015 Lausanne, Switzerland;

    Ceramics Laboratory, EPFL-Swiss Federal Institute of Technology, CH-1015 Lausanne, Switzerland;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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