首页> 外文期刊>Applied Physics Letters >Electronic structure of C and N co-doped TiO_2: A combined hard x-ray photoemission spectroscopy and density functional theory study
【24h】

Electronic structure of C and N co-doped TiO_2: A combined hard x-ray photoemission spectroscopy and density functional theory study

机译:C和N共掺杂TiO_2的电子结构:硬X射线光发射光谱和密度泛函理论的组合研究

获取原文
获取原文并翻译 | 示例
           

摘要

We have studied the electronic structure of C and N co-doped TiO_2 using hard x-ray photoelectron spectroscopy and first-principles density functional theory calculations. Our results reveal overlap of the 2p states of O, N, and C in the system which shifts the valence band maximum towards the Fermi level. Combined with optical data we show that co-doping is an effective route for band gap reduction in TiO_2. Comparison of the measured valence band with theoretical photoemission density of states reveals the possibility of C on Ti and N on O site.
机译:我们使用硬X射线光电子能谱和第一原理密度泛函理论计算研究了碳和氮共掺杂的TiO_2的电子结构。我们的结果表明,系统中O,N和C的2p状态重叠,从而使价带最大值移向费米能级。结合光学数据,我们表明共掺杂是减少TiO_2带隙的有效途径。将测得的价带与状态的理论光发射密度进行比较,揭示了Ti上碳原子和O原子上N原子的可能性。

著录项

  • 来源
    《Applied Physics Letters》 |2014年第22期|221605.1-221605.5|共5页
  • 作者单位

    Department of Physics and Astronomy, University of Delaware, Newark, Delaware 19716, USA;

    Center for Computational Studies of Advanced Electronic Material Properties, Yonsei University, Seoul 120-749, South Korea,Department of Physics and IPAP, Yonsei University, Seoul 120-749, South Korea;

    National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11973, USA;

    National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11973, USA;

    National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA;

    Center for Computational Studies of Advanced Electronic Material Properties, Yonsei University, Seoul 120-749, South Korea,Department of Physics and IPAP, Yonsei University, Seoul 120-749, South Korea;

    Department of Physics and Astronomy, University of Delaware, Newark, Delaware 19716, USA,Department of Materials Science and Engineering, University of Delaware, Newark, Delaware 19716, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号