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Selective-area growth of heavily n-doped GaAs nanostubs on Si(001) by molecular beam epitaxy

机译:通过分子束外延在Si(001)上重掺杂n掺杂的GaAs纳米管的选择性区域生长

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摘要

Using an aspect ratio trapping technique, we demonstrate molecular beam epitaxy of GaAs nanostubs on Si(001) substrates. Nanoholes in a SiO_2 mask act as a template for GaAs-on-Si selective-area growth (SAG) of nanostubs 120nm tall and ≤100nm in diameter. We investigate the influence of growth parameters including substrate temperature and growth rate on SAG. Optimizing these parameters results in complete selectivity with GaAs growth only on the exposed Si(001). Due to the confined-geometry, strain and defects in the GaAs nanostubs are restricted in lateral dimensions, and surface energy is further minimized. We assess the electrical properties of the selectively grown GaAs nanostubs by fabricating heterogeneous p~+-Si~+-GaAs p-n diodes.
机译:使用长宽比捕获技术,我们证明了Si(001)衬底上GaAs纳米桩的分子束外延。 SiO_2掩模中的纳米孔充当了120nm高,直径≤100nm纳米管的GaAs-on-Si选择性区域生长(SAG)的模板。我们研究了包括衬底温度和生长速率在内的生长参数对SAG的影响。优化这些参数可以使GaAs仅在裸露的Si(001)上具有完全的选择性。由于几何形状的限制,GaAs纳米管中的应变和缺陷在横向尺寸上受到限制,并且表面能进一步最小化。我们通过制造异质p〜+ -Si / n〜+ -GaAs p-n二极管来评估选择性生长的GaAs纳米管的电性能。

著录项

  • 来源
    《Applied Physics Letters》 |2016年第16期|163106.1-163106.5|共5页
  • 作者单位

    Department of Electrical Engineering, UCLA, Los Angeles, California 90095, USA;

    Departments of Physics/Materials Science and Engineering, Boise State University, Boise, Idaho 83725, USA;

    Department of Materials Science and Engineering, UCLA, Los Angeles, California 90095, USA;

    Department of Materials Science and Engineering, UCLA, Los Angeles, California 90095, USA;

    Department of Electrical Engineering, UCLA, Los Angeles, California 90095, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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