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Transport characteristics of novel degenerate semiconductor materials: Chalcogenide based thermoelectric systems and cadmium oxide based thin film transparent conducting oxide systems.

机译:新型简并半导体材料的传输特性:基于硫属化物的热电系统和基于氧化镉的薄膜透明导电氧化物系统。

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摘要

Extensive charge transport measurements of new thermoelectric and transparent conducting oxide degenerate semiconductor materials have been reviewed. Measurements of electrical conductivity, thermopower, carrier mobility and carrier concentration as a function of temperature for these systems have been studied to give insight into the fundamental electrical transport processes, and provide feedback for the development and improvement of materials for practical applications. This research has been multidisciplinary, requiring the collective skills of researchers in chemistry, materials science, physics and electrical engineering.; Thermoelectric materials based upon CsBi4Te6, Pb 5Bi6Se14, Yb5In2Sb 6, AgPb18BSbTe20, beta-K2Bi 8Se13 and Rb2Bi8Se13 were investigated with the goal of exceeding the performance of commercially available Bi2Te3 based alloys, the accepted standard for cooling applications at or below room temperature. Studies included modifying transport properties of these thermoelectric materials through alloying and doping, as well as small modifications of the stoichiometric ratios of the constituent elements.; Thermoelectric materials based upon CsBi4Te6 and beta-K 2Bi8Se13 appear quite promising below room temperature and in several instances have exceeded the performance of Bi2Te 3 based alloys. Thermoelectric materials based upon beta-K2Bi 8Se13, Pb5Bi6Se14, AgPb 18SbTe20 and Rb2Bi8Se13 all exhibit figure of merit values that continue to increase above room temperature. These materials appear to be promising candidates for thermoelectric applications above 400 K.; Transparent conducting oxide thin films based upon CdO grown by both MOCVD and PLD techniques were studied. The primary goal was to exceed the electrical performance of commercially available indium tin oxide, the acknowledged standard for optoelectronic applications of TCOs. This investigation resulted in improved film quality through new MOCVD precursors and modifications in growth conditions, as well as improvements in the electrical and optical properties through both doping and employing multilayer thin film structures. Improved electrical properties of both undoped and doped CdO over that of ITO were achieved without reduction in optical transparency, and increased optical transparency was achieved through the Burstein-Moss shift.
机译:审查了新的热电和透明导电氧化物简并的半导体材料的广泛的电荷传输测量。已经研究了这些系统的电导率,热功率,载流子迁移率和载流子浓度随温度的变化,以了解基本的电传输过程,并为实际应用中材料的开发和改进提供反馈。这项研究是多学科的,需要化学,材料科学,物理学和电气工程领域的研究人员具有集体才能。研究了基于CsBi4Te6,Pb 5Bi6Se14,Yb5In2Sb 6,AgPb18BSbTe20,β-K2Bi8Se13和Rb2Bi8Se13的热电材料,其目标是超越商用Bi2Te3基合金的性能,后者是室温或低于室温的冷却应用的公认标准。研究包括通过合金化和掺杂来改变这些热电材料的传输性能,以及对组成元素的化学计量比进行小的修改。基于CsBi4Te6和β-K2Bi8Se13的热电材料在室温以下显得很有希望,并且在某些情况下已经超过了Bi2Te 3基合金的性能。基于β-K2Bi8Se13,Pb5Bi6Se14,AgPb 18SbTe20和Rb2Bi8Se13的热电材料均显示出品质因数,并在室温以上继续增加。这些材料似乎是400 K以上热电应用的有前途的候选材料。研究了通过MOCVD和PLD技术生长的基于CdO的透明导电氧化物薄膜。主要目标是超越商用氧化铟锡(TCO的光电应用公认标准)的电气性能。这项研究通过使用新的MOCVD前驱物和改进生长条件来改善薄膜质量,并通过掺杂和采用多层薄膜结构来改善电学和光学性能。在不降低光学透明度的情况下,实现了未掺杂和掺杂的CdO的电性能均优于ITO的改进,并且通过Burstein-Moss位移获得了更高的光学透明度。

著录项

  • 作者

    Ireland, John R.;

  • 作者单位

    Northwestern University.;

  • 授予单位 Northwestern University.;
  • 学科 Engineering Electronics and Electrical.
  • 学位 Ph.D.
  • 年度 2004
  • 页码 416 p.
  • 总页数 416
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 无线电电子学、电信技术;
  • 关键词

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