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Investigation of the Metal-insulator Transition in n-3C-SiC Epitaxial Films

机译:n-3C-SiC外延膜中金属-绝缘体转变的研究

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摘要

N-type 3C-SiC films have been grown by sublimation epitaxy on hexagonal silicon carbide substrates. The low-temperature conductivity and magnetoresistance of the films have been studied in relation to their doping level and structural perfection. It was found that a metal-insulator transition occurs in the n-3C-SiC layer at concentrations N_d - N_a ≤ 3 10~(17) cm~(-3).
机译:通过升华外延在六角形碳化硅衬底上生长了N型3C-SiC膜。研究了薄膜的低温电导率和磁电阻与掺杂水平和结构完善性的关系。发现在n_d-N_a≤3 10〜(17)cm〜(-3)的浓度下,n-3C-SiC层中发生了金属-绝缘体转变。

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