Positron and Positronium Studies of Functional Films with an Intense Slow Positron Beam

摘要

Characterization of atomic-scale and/or nano-scale structures, especially in thin films or near surface regions, is extremely important in the field of research and development of advanced materials because various material properties are influenced by those structures. In order to perform materials characterization on thin films and near surface regions, we have constructed an intense variable-energy pulsed positron beam at the AIST electron LINAC facility and developed several measurement techniques---positron annihilation lifetime spectroscopy (PALS), age-momentum correlation spectroscopy (AMOC), 2D (age-pulse height) PALS, positronium time-of-flight spectroscopy (Ps-TOF), positron annihilation induced Auger electron spectroscopy (PAES). Furthermore, a focused pulsed positron beam has been developed recently.