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Effects of electric field on thermal and tunneling carrier escape in InAs/GaAs quantum dot solar cells

机译:电场对InAs / GaAs量子点太阳能电池热载流子和隧穿载流子逸出的影响

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The effects of electric field on carrier escape in InAs/GaAs quantum dots embedded in a p-i-n solar cell structures have been studied by quantum efficiency. Via band structure simulation, effective barrier height of carriers inside QDs is reduced with increasing local electric field, so tunneling and thermal escape are enhanced. At 300K, when electric field intensity is below 40kV/cm, thermal escape is dominant in all confined states in QDs; when electric field intensity is above 40kV/cm, tunneling is dominant in shallow confined states and thermal escape is dominant in the ground state of QDs.
机译:通过量子效率研究了电场对嵌入p-i-n太阳能电池结构中的InAs / GaAs量子点中载流子逸出的影响。通过能带结构仿真,量子点内部载流子的有效势垒高度随着局部电场的增加而减小,从而增强了隧穿和热逸出。在300K时,当电场强度低于40kV / cm时,QD中所有密闭状态下的热逸散都占主导地位。当电场强度超过40kV / cm时,在QDs的浅密闭状态下隧穿占主导地位,而在QD的基态下热逃逸占主导地位。

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