首页> 外国专利> GaAsSb layer with graded composition reducing stress in InAs/GaAs quantum dots

GaAsSb layer with graded composition reducing stress in InAs/GaAs quantum dots

机译:具有梯度成分的GaAsSb层可降低InAs / GaAs量子点中的应力

摘要

In the present invention, there is disclosed a multilayer semiconductor epitaxial structure with InAs/GaAs quantum dots and GaAsSb cover and stress reducing layer maintaining heterotransition of the type I between InAs quantum dot and GaAsSb layer and enabling emission of electroluminescences on a telecommunication wavelength of 1300 nm. The maintenance of the heterotransition of the type I for this wavelength is achieved by graded composition of the GaAsi1-xSbix layer such that immediately close to the quantum dots in the GaAsSb layer, the concentration of the Sb (x=0.03 through 0.09) is lower (to thereby ensure sufficient barrier for holes in the InAs quantum dots and their localization within the quantum dots), while in the direction to the epitaxial growth the antimony concentration in the GaAsSb increases to the maximum concentration, which is in the range of x=0.15 through 0.30. (By this, the necessary relief of stress inside the quantum dots and prolongation of the emitted wavelength is achieved). The structure can be implemented with a continuous or graded change in antimony concentration by means of two or more layers.
机译:在本发明中,公开了一种多层半导体外延结构,其具有InAs / GaAs量子点和GaAsSb覆盖层以及应力减小层,所述应力减小层保持InAs量子点和GaAsSb层之间的I型异质转变并且能够在1300nm的电信波长上发射电致发光纳米通过渐变组成的GaAsi1-xSbix层,可以维持该类型I的异质过渡,这样,在紧邻GaAsSb层中的量子点时,Sb的浓度较低(x = 0.03至0.09) (从而确保对InAs量子点中的空穴及其在量子点中的定位具有足够的势垒),而在朝外延生长的方向上,GaAsSb中的锑浓度增加到最大浓度,该最大浓度在x = 0.15至0.30。 (通过这种方式,可以实现量子点内部应力的必要缓解和发射波长的延长)。该结构可以通过两层或多层来实现锑浓度的连续或分级变化。

著录项

  • 公开/公告号CZ303855B6

    专利类型

  • 公开/公告日2013-05-29

    原文格式PDF

  • 申请/专利权人 FYZIKALNI ·STAV AV CR V.V.I.;

    申请/专利号CZ20110000570

  • 发明设计人 OSWALD JIRI;PANGRAC JIRI;HOSPODKOVA ALICE;

    申请日2011-09-14

  • 分类号B82Y20/00;H01L31/0304;H01L31/0352;H01L31/0693;H01L31/102;H01S5/34;

  • 国家 CZ

  • 入库时间 2022-08-21 16:41:58

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号