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Catadioptric Lens Design: The Breakthrough to Hyper-NA Optics

机译:折反射透镜设计:超NA光学器件的突破

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To enable optical lithography for sub 55 nm features, ArF immersion lithography requires numerical apertures to be significantly larger than 1 - thus leading to new challenges for optical design. Refractive lens designs are not capable to capture these extreme etendues. Catadioptric lens designs can overcome these fundamental issues by keeping the diameters of the optical materials acceptable. We have studied various Catadioptric design approaches. The main criteria used to evaluate the potential of the different solutions include mechanical complexity, reticle compatibility, optical sensitivities, polarization capabilities, image field shape, as well as enabling extendibility to even higher NAs. Our assessment leads us to a new design type called Catadioptric in-line design which shows superior performance for high NA systems with NA > 1.1.
机译:为了实现低于55 nm的光学光刻技术,ArF浸没式光刻技术要求数值孔径显着大于1,从而给光学设计提出了新的挑战。屈光镜片设计无法捕获这些极端的光学扩展量。折反射透镜设计可以通过保持光学材料的直径可接受来克服这些基本问题。我们研究了各种折反射设计方法。用于评估不同解决方案潜力的主要标准包括机械复杂性,标线片兼容性,光学灵敏度,偏振能力,像场形状,以及能够扩展到更高的NA。我们的评估使我们得出了一种称为反折线内联设计的新设计类型,该设计类型对NA> 1.1的高NA系统显示出优异的性能。

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