Can IC test learn from how a tester is tested

摘要

A tester as well as IC is a system at different abstraction levels. The testing of each of these systems should contain individual component testing as well as a full system level functional test to ensure its functional correctness. In Ref [1-2], an event tester was described. The main attributes of event tester are that it uses vectors directly from the design simulation (vcd); thus, it avoids vector conversion processes and allows event edit/manipulation for test/debug. The implementation of event tester required all new hardware as well as whole new tester software. The hardware design included a new ASIC, design of new pincard, motherboard and backplane as well as a new testhead, hifix and loadboard. The software design included a new compiler, a new middleware, a new application server, a new kernel and a new user's interface.