Scan and BIST can almost achieve test quality levels

摘要

Structural testing with both scan test and Built-in Self-Test (BIST) has proven effective for detecting both gross static and at-speed defects. As tools and techniques improve, structural testing is approaching the high level of test quality necessary to eliminate test escapes. However, scan and BIST do not accomplish all that is needed. Parametric and functional tests are still needed for advanced microprocessor and Systems on Chip (SoC) designs.