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Plasma Characteristics of Single Crystal Silicon Irradiated by Millisecond Pulsed Laser

机译:毫秒脉冲激光照射单晶硅的等离子体特性

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In the air, Mach-zehnder interference system was set up to study the plasma expansion process of single crystal silicon induced by millisecond pulsed laser. Electron density is the main parameter of laser plasma characteristics. Calculation electron density of silicon plasma based on the relationship between the FWHM of Stark broadening of spectral line and the electron density. Experimental results show that: The existence material splash phenomenon is existence in silicon plasma generated by millisecond laser, the long pulse laser interaction with material has the thermal effect. Silicon plasma emission spectrum is strong in the distribution of the continuous spectrum, the discrete series of atoms and ions are superimposed on it. With the increase of the laser energy density, the electron density of the plasma increases.
机译:在空中,建立了Mach-Zehnder干扰系统以研究由毫秒脉冲激光诱导的单晶硅的等离子体膨胀过程。电子密度是激光等离子体特性的主要参数。基于谱线和电子密度的STARK扩展的FWHM与电子密度的关系计算电子密度。实验结果表明:存在材料飞溅现象存在于毫秒激光器产生的硅等离子体中,与材料的长脉冲激光相互作用具有热效应。硅等离子体发射光谱在连续频谱的分布中强,离散系列原子和离子叠加在其上。随着激光能量密度的增加,等离子体的电子密度增加。

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