首页>
外文会议>SMTA Medical Electronics Symposium
>Capability Enhancement in SMT Defect Mitigation and AOI Driven Defect Detection on a Medical Electronics SMT line - (PPT)
【24h】
Capability Enhancement in SMT Defect Mitigation and AOI Driven Defect Detection on a Medical Electronics SMT line - (PPT)
Significantly lower frequency of tombstoning with oval apertures compared to rectangular. Misalignment of component placement with respect to paste deposit contributes to majority of defects. Higher pad coverage from oval geometry leads to fewer tombstones.
展开▼