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DEFECT DETECTION METHOD, DEFECT INSPECTION METHOD, DEFECT DETECTION DEVICE, DEFECT INSPECTION DEVICE, DEFECT DETECTION PROGRAM AND RECORDING MEDIUM FOR RECORDING PROGRAM
DEFECT DETECTION METHOD, DEFECT INSPECTION METHOD, DEFECT DETECTION DEVICE, DEFECT INSPECTION DEVICE, DEFECT DETECTION PROGRAM AND RECORDING MEDIUM FOR RECORDING PROGRAM
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机译:缺陷检测方法,缺陷检测方法,缺陷检测设备,缺陷检测设备,缺陷检测程序和用于记录程序的记录介质
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摘要
PROBLEM TO BE SOLVED: To provide an optical panel inspection method capable of performing properly rank determination based on only display defects having a prescribed area or more.;SOLUTION: An image by a liquid crystal panel is imaged, to thereby acquire image data (inspection image acquisition process). Brightness data of each pixel of a point defect or a strain defect having a smaller area than an irregular defect in the image data acquired in the inspection image acquisition process is replaced with an interpolation value based on brightness data of a peripheral pixel, to thereby repair the non-evaluation object defect species (point/strain defect repair process ST200). An irregular defect is detected in image data wherein the point/strain defect is repaired in the point/strain defect repair process ST200 (irregular defect detection process ST300). Rank determination of the liquid crystal panel is performed based on a defect area of the irregular defect and average brightness detected in the irregular defect detection process (ST300) (rank determination process ST400).;COPYRIGHT: (C)2007,JPO&INPIT
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