Recently, the sampling frequency and resolution of analog-to-digital converters (ADCs) embedded in Mixed Signal System-On-Chips (SOCs) has been increasing. As a result, testing the dynamic performance of these ADCs is a challenge for ATE because the analog signal source instrument, typically an Arbitrary Waveform Generator (AWG), must generate a clean sine waveform with an output frequency of around 30 MHz to 100 MHz. This paper introduces a method to generate a very low distortion sine waveform, which far exceeds the specification of the AWG used, by applying a reverse phase component to the distortion. Actual experiments show this method reduces the 2nd order harmonic distortion by 31 dB and 3rd order harmonic distortion by 25 dB at a 50 MHz AWG output frequency. With this method, testing the dynamic performance of Mixed Signal SOCs and high frequency, high resolution ADCs can be accomplished using a legacy, low cost AWG.
展开▼
