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Growth of stacked InAs/InP quantum dot structures

机译:堆叠INAS / INP量子点结构的生长

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We report on the growth of self-assembled InAs/InP quantum dots (QDs) on the lattice matched GaInAsP buffer by low pressure Metal Organic Chemical Vapor Deposition and discuss the effects of a thin GaAs interlayer, the QD growth time, and the V/III ratio on the QD nucleation. The GaAs interlayer reduces the As/P exchange reaction, consumes the indium layer segregated on the GaInAsP buffer surface and causes some gallium diffusion to the QDs. As a result, the QD photoluminescence (PL) emission wavelength blue shifts, the PL intensity increases and the PL linewidth decreases. As the QD growth time increases, the PL emission wavelength red-shifts but the PL linewidth increases due to further QD size fluctuations. An increase in the V/III ratio reduces the QD density and in general increases the QD size. The PL intensity is enhanced in stacked QD structures without any linewidth broadening compared to that of a single QD layer structure.
机译:我们通过低压金属有机化学气相沉积报告晶格匹配的Gaiasp缓冲器上的自组装INAS / INP量子点(QDS)的生长,并讨论薄GaAs中间层,QD生长时间和v /的效果 III与QD成核的比率。 GaAs interlayer降低了AS / P换交换反应,消耗在增强缓冲表面上隔离的铟层,并使一些镓扩散到QDS上。 结果,QD光致发光(PL)发射波长蓝偏移,PL强度增加并且PL线宽减小。 随着QD生长时间增加,PL发射波长红移,但PL线宽由于进一步的QD尺寸波动而增加。 V / III比率的增加降低了QD密度,并且通常增加QD尺寸。 与单个QD层结构相比,在堆叠的QD结构中,PL强度在堆叠的QD结构中增强。

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