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Thermal Fatigue Life Analysis and Forecast of PBGA Solder Joints On the Flexible PCB Based on Finite Element Analysis

机译:基于有限元分析的柔性PCB上PBGA焊点的热疲劳寿命分析及预测

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Thermal fatigue life of PBGA (Plastic Ball Grid Array) solder joint on the FPC (Flexible Printed Circuit) was analysed based on finite element analysis. According to symmetry theory, a quarter finite element model of 144-PIN PBGA was established. Both the stress and strain of lead and lead-free PBGA solder joints on the flexible PCB with the basic material of polyimide were studied by non-linear finite element analysis (FEA) respectively under -55~125°Cthermal cycling. Based on the plastic strain calculated by FEA and Coffin-Manson formula, the thermal fatigue life of key lead and lead-free solder joints on the flexible PCB was calculated respectively. The results show that: (1) In the process of thermal cycling loading, the outside solder joint which is the farthest away from the inter-connect center of PBGA undergoes the largest alternating stress and strain; (2) Temperature has great impact on stress and strain in solder joint, and in the process of temperature remaining, the stress and strain has little change, however, it arise rapidly in the process of temperature decreasing while drops fast in heating-up period. (3) Plastic strain of dangerous point is accumulated in the process of temperature cycling, which will ultimately cause solder joint failure. (4) Compared with the lead-free solder joints, the lead ones of PBGA obviously have the longer fatigue life.
机译:基于有限元分析,分析了FPC(柔性印刷电路)上PBGA(塑料球栅阵列)焊点的热疲劳寿命。根据对称理论,建立了144针PBGA的四分之一有限元模型。通过分别在-55〜125°C热循环下,通过非线性有限元分析(FEA)研究了柔性PCB上具有基础材料的柔性PCB的引线和无铅PBGA焊点的应力和菌株。基于由FEA和Coffin-Manson公式计算的塑性应变,分别计算了柔性PCB上的键铅和无铅焊点的热疲劳寿命。结果表明:(1)在热循环加载过程中,外部焊点,其远离PBGA间距离的偏远中心最大的交替应力和应变; (2)温度对焊点的应力和应变产生很大影响,在剩余温度的过程中,应力和菌株几乎没有变化,然而,在温度下降的过程中迅速产生,同时在加热期内快速下降。 (3)塑料危险点累积在温度循环过程中,最终会导致焊接接头失效。 (4)与无铅焊点相比,PBGA的铅显着疲劳寿命较长。

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