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The Influence of Total and Oxygen Partial Pressures on Structure and Hydrophilic Property of TiO_2 Thin Films Deposited by Reactive DC Magnetron Sputtering

机译:总反应直流磁控溅射沉积的TiO_2薄膜结构和亲水性的影响

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TiO_2 thin films have been deposited by reactive DC magnetron sputtering technique to study the effect of total pressure and oxygen partial pressure on structure and hydrophilic properties. The crystal structure and hydrophilic property was measured by XRD and contact angle meter, respectively. The results showed that the films were composed of pure rutile and mixed of anatase/rutile structure dependent on the total pressure and oxygen partial pressure. It was found that all films can perform hydrophilic property. In case of high total pressure, the films showed superhydrophilic property, whereas the films deposited under various oxygen partial pressures with fixed total pressure were all films exhibit superhydrophilic property.
机译:通过反应性DC磁控溅射技术沉积TiO_2薄膜,以研究总压力和氧分压对结构和亲水性的影响。晶体结构和亲水性分别通过XRD和接触角计测量。结果表明,薄膜由纯金红石组成,并依赖于总压力和氧分压的锐钛矿/金红石结构混合。发现所有薄膜可以进行亲水性。在总压力高的情况下,薄膜显示出超硫酸性能,而在具有固定总压力的各种氧局部压下的膜沉积的薄膜是所有薄膜表现出超硫酸性能。

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