Method for Troubleshooting Power Integrity Problems in Programmable Logic Device Electronic Systems by Embedded Measurement of Power Distribution Impedance

摘要

Power distribution networks (PDN) may degrade in time due to various reliability factors including tantalum capacitors with burned internal fuses that become open circuits, dried electrolytic capacitors, decoupling capacitors or interconnect solder joints open or with increased resistance. This paper proposes a method for troubleshooting power integrity problems in systems using programmable logic devices (PLD). The method configures part of the PLD to internally measure the impedance of its power distribution network. This embedded PDN measurement core uses only logic blocks commonly available in any existing PLD without the need of built-in dedicated circuits. The frequency profile of PDN impedance can be measured on production floors or remotely in systems installed in the field by activating and communicating with the embedded PDN impedance measurement core. Archived frequency profiles along various periods of time can help identify PDN issues or study any potential long-term power distribution degradation of systems.