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High-performance InAs quantum-dot infrared photodetectors grown on InP substrate operating at room temperature and high operating temperature focal plane array

机译:在室温和高工作温度焦平面阵列中运行的INP基板上生长的高性能INAS量子点红外光电探测器

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We report a room temperature operating InAs quantum-dot infrared photodetector grown on InP substrate. The self-assembled InAs quantum dots and the device structure were grown by low-pressure metalorganic chemical vapor depositon. The detectivity was 2.8 x 1011 cmHz1/2/W at 120 K and a bias of -5 V with a peak detection wavelength around 4.1 &mgr;m and a quantum efficiency of 35 %. Due to the low dark current and high responsivity, a clear photoresponse has been observed at room temperature, which gives a detectivity of 6.7 x 107 cmHz1/2/W. A 320 x 256 middle wavelength infrared focal plane array operating at temperatures up to 200 K was also fabricated based on this kind of a device. The focal plane array had 34 mA/W responsivity, 1.1 % conversion efficiency, and noise equivalent temperature difference of 344 mK at 120 K operating temperature.
机译:我们报告了在INP基板上生长的室温操作INAS量子点红外光电探测器。通过低压金属化学蒸气沉积物生长自组装的INAS量子点和器件结构。探测率为2.8×1011cmHz1 / 2 / W,在120 k和-5V的偏置,峰值检测波长为4.1&mgr; m和量子效率为35%。由于低暗电流和高响应度,在室温下观察到清晰的光响应,其探测器为6.7×107cmHz1 / 2 / w。在高达200 k温度下操作的320 x 256中间波长红外焦平面阵列也基于这种装置制造。焦平面阵列具有34 mA / W响应度,1.1%转换效率,以及120k工作温度的344 mk的噪声等效温度差。

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