Optical near-field photoluminescence as well as microphotoluminescence spectra often show many tens of sharp lines in each local spectrum.' Just by looking at such huge data sets, it is generally rather difficult to extract relevant information of the sample properties. Thus, the recent theoretical prediction of Runge and Zimmermann, to use the averaged autocorrelations of individual local optical spectra in order to reveal hidden spectral correlations, has opened a new route towards statistical analysis. This statistical procedure was applied and modified by us quite recently in such away that it becomes suitable for typical experimental spectra. In this form, it was successfully applied to single thin films of CdSe/ZnSe, which have shown no signs of level repulsion. Preliminary results on level repulsion in a GaAs QW have also been presented.
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