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Extraction of SPICE Model for Double Gate Vertical MOSFET

机译:双栅垂直MOSFET的香料模型提取

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Vertical MOSFETs device have one important disadvantage, which is higher overlap capacitances such as the separated gate-source and gate-drain parasitic capacitances (CGSO and CGDO), which is known to be most crucial to the high-frequency/speed performance but very hard to extract. In this paper presents parameter extraction techniques to create an extended BSIM model card of vertical p-MOSFETs for circuit simulation with SPICE can be accurately obtained for these overlap capacitances determination.This device was modeled as a subcircuit with any sub elements such as resistors, capacitors and diodes that capture the parasitic effects. The subcircuit was simplified in order to modeling in BSIM easily. The overlap capacitances of vertical p-MOSFET can be determined by using capacitance parameter extraction of quasi static small signal equivalent circuit. The result showed that gate-drain paracitic capacitance (CGDO) is larger than gate-source parasitic capacitance (CGSO).
机译:垂直MOSFET器件具有一个重要的缺点,其重叠电容较高,例如分离的栅极 - 源和栅极 - 漏极寄生电容(CGSO和CGDO),已知对高频/速度性能最为关键但非常硬提取。本文提出了参数提取技术,以创建垂直P-MOSFET的扩展BSIM模型卡,用于电路模拟与香料可以精确地获得这些重叠电容确定。该器件被建模为具有任何子元素,如电阻器,电容器的子元素(如电阻器)为子狼能。和捕获寄生效应的二极管。简化了子狼圈以便在BSIM中易于建模。垂直P-MOSFET的重叠电容可以通过使用准静态小信号等效电路的电容参数提取来确定。结果表明,栅极 - 漏极脱落电容(CGDO)大于栅极源寄生电容(CGSO)。

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