Leaf rust, caused by Puccinia triticina, is a common disease of wheat worldwide. Little is known regarding the genes that confer leaf rust resistance in durum wheat (Triticum turgidum). In 2001 a new race of P. triticina, identified as BBG/BN, was detected in Northwestern Mexico, and about 80% of CIMMYT durum wheat germplasm was susceptible to this new race. To identify genetic diversity for resistance, five resistant durum wheat genotypes were selected based on diverse seedling and adult-plant infection types to race BBG/BN. These resistant genotypes were crossed with the susceptible Mexican cultivar ' Atil C2000' and also intercrossed in a half-diallel arrangement. Parents, Fl hybrids, and F2 populations were evaluated for resistance to race BBG/BN under greenhouse conditions. The seedling and adult-plant infection types associated with resistance and segregation in the F2 populations indicated that resistance in each parent was monogenic and controlled by different genes or alleles. Parents, F2and F3 generations are being evaluated in the field.
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