Toward the matrix polarimetry method of thin film coatings

摘要

The results obtained from studying the impact of optical-geometrical parameters of thin-layered models containing the particles of different shapes and sizes as well as the degree of orient ability toward their light scattering matrices how been analyzed. A special emphasis is placed upon the peculiar aspects of the matrix polarymetry method and it is in fact expedient to use this technique in implementing and developing the non-destructive methods to control thin film coatings.