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Physics of Nano-Interfaces and Nano-Structures for Future Si Nano-Devices

机译:未来硅纳米器件的纳米界面和纳米结构的物理学

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Due to the aggressive scaling of semiconductor devices, present semiconductor devices contain various kinds of nano-scale interfaces and nano-structures. In this paper, we show two examples in which physics can really give guiding principles for future semiconductor technologies. First, we discuss physics for future Si nanowire FET. When one-dimensional ballistic conduction is achieved, the hole conductivity of a Si nanowire FET is basically determined by the number of hole quantum channels near the valence band maximum (VBM). However, as the density of bands increase, the spacing of each band becomes narrower, which will allow inter sub-band scattering and eventually reduces the conductivity. In the light of the above discussions, it may be concluded that there exists a trade-off between the quantum channel numbers and inter sub-band scattering and an optimum size exists for Si nanowire FET applications. Moreover, we also discuss our new interface physics which is crucial for controlling threshold voltages in high-k gate stacks.
机译:由于半导体器件的激进缩放,存在的半导体器件包含各种纳米级界面和纳米结构。在本文中,我们展示了两个例子,其中物理可以真正为未来的半导体技术提供指导原则。首先,我们讨论未来SI纳米线FET的物理学。当实现一维弹道传导时,Si纳米线FET的空穴导电性基本上由靠近价带最大值(VBM)附近的孔量子通道的数量。然而,随着波段的密度增加,每个频带的间距变窄,这将允许帧间带散射并且最终降低导电性。鉴于上述讨论,可以得出结论,在量子频道数和亚频带散射之间存在折衷,并且对于Si纳米线FET应用存在最佳尺寸。此外,我们还讨论了我们的新界面物理,这对于控制高k门堆叠中的阈值电压至关重要。

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