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Ionic Debris Assessment of Various EUVL Systems

机译:各种EUVL系统的离子碎片评估

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Debris generation in EUV sources is a real threat to the lifetime of collector optics. Debris measurements in thesesources are of immense importance to enable source suppliers to estimate collector lifetime. Ion debris measurementsperformed so far are not consistent and in part incomplete. To verify lifetime claims from different EUV sourcesuppliers, SEMATECH, which is leading this investigation, has collaborated with and provided funding to the Center forPlasma Material Interactions (CPMI) at the University of Illinois to build a fully calibrated and standardized sphericalsector electrostatic energy analyzer (ICE). This device is capable of measuring ion debris flux in absolute units. Inaddition to ion flux, the detector is also capable of identifying different ion species present in the plasma, which can bediscriminated based on energy-to-charge ratio. The lifetime of collector optics is calculated using the measured ion flux.This device was fabricated for SEMATECH with the sole aim of traveling to different EUV source suppliers' sitesaround the world and collecting ion debris data. SEMATECH has measured ion debris from different EUV sourcesaround the world, using a 1 to 14keV ion energy range under different source operational conditions (chamber pressure,pinch frequency, pinch power, angle). These measurements identify the need for debris mitigation in all the EUVsources investigated under this project. They also give source suppliers an opportunity to improve and optimize theperformance of their respective sources. The information on absolute ion fluxes is an advantage to source suppliers,allowing them to design and develop effective debris mitigation schemes, which can again be tested for theireffectiveness using the ion diagnostic tool. As the debris consists of ions and neutrals, the next logical step is to developa standardized neutral detector to measure the flux and energy distribution of neutrals present in EUV plasma sources.Taking into account both ions and neutral fluxes, more definitive conclusions on the performance of a EUV source canbe made and better collector lifetime estimation models can be derived. The Illinois Calibrated ESA (ICE) tool is nowpart of the SEMATECH "Flying Circus" equipment set.
机译:EUV来源中的碎片生成是对收集光学终身的真正威胁。测试中的碎片测量值得普遍的重要性,使源供应商能够估算收集器寿命。到目前为止,离子碎片尺寸尺寸不一致,部分不完整。为了验证来自不同EUV SourceSuppliers的终身索赔,领导这项调查的Sematech与伊利诺伊大学的中心飞行员材料相互作用(CPMI)进行了合作,并为伊利诺伊大学提供了完全校准和标准化的球形传感器静电能量分析仪(冰)。该装置能够以绝对单位测量离子碎片磁通量。 Inddition对离子磁通量,检测器还能够识别在等离子体中存在的不同离子物种,其可以基于能量 - 电荷比伪刺皱。采用测量的离子磁通计算收集光学元件的寿命。该器件是针对Sematech制造的,其唯一的目的是旅行到不同的EUV源供应商的位数,以及收集离子碎片数据。 Sematech在不同的EUV ScessAround中测量了离子碎片,在不同的源操作条件下使用1至14KeV离子能量范围(腔室压,夹频,捏码,角度)。这些测量标识在该项目下调查的所有EUVSORS中的碎片减缓需求。他们还提供资源供应商有机会改进和优化各自来源的表现。关于绝对离子通量的信息是源供应商的优点,使它们能够设计和开发有效的碎屑缓解方案,可以使用离子诊断工具再次测试它们的效应。随着碎片由离子和中性组成,下一个逻辑步骤是发展标准化中性探测器,以测量EUV等离子体源中存在的中性的助焊剂和能量分布。考虑到离子和中性势量,更明确的表现结论可以派生EUV源,并可导出更好的收集器寿命估算模型。伊利诺伊州校准的ESA(ICE)工具是DEMATECH“飞行马戏团”设备套装。

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