首页> 外文会议>Electron Devices Meeting, 2001. IEDM Technical Digest. International >Impact of quantum mechanical effects on design of nano-scale narrow channel n- and p-type MOSFETs
【24h】

Impact of quantum mechanical effects on design of nano-scale narrow channel n- and p-type MOSFETs

机译:量子力学效应对纳米级窄沟道n型和p型MOSFET设计的影响

获取原文

摘要

The impact of quantum mechanical effects and device design guidelines in nano-scale narrow channel n-type and p-type MOSFETs is presented. Ultra-narrow channel MOSFETs with n- and p-type source/drain have been successfully fabricated and threshold voltage increase due to quantum confinement has been clearly observed in both n- and p-type devices. By analytical calculations, device design for threshold voltage adjustment in n- and p-type MOSFETs using quantum mechanical effects is discussed. The calculations also demonstrate that an ultra-narrow channel along the >100< direction has a large advantage in device design over the >110< direction due to higher mobility.
机译:提出了量子力学效应和器件设计指南对纳米级窄通道n型和p型MOSFET的影响。具有n型和p型源极/漏极的超窄通道MOSFET已成功制造,并且在n型和p型器件中都清楚地观察到由于量子限制而导致的阈值电压增加。通过分析计算,讨论了利用量子力学效应调节n型和p型MOSFET阈值电压的器件设计。计算还表明,由于> 100 <方向的超窄通道具有更高的迁移率,因此在设备设计方面比> 110 <方向具有更大的优势。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号