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A Study of 0201 's and Tombstoning in Lead-Free Systems, Phase II Comparison of Final Finishes and Solder Paste Formulations

机译:无铅系统中的0201和墓碑研究,最终表面处理和焊膏配方的第二阶段比较

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Tombstoning, the phenomena where a chip component stands up on one end during the reflow cycle, is well-documented and understood in tin-lead systems. It is reported to occur more frequently in lead-free systems, and smaller components are at greater risk than larger ones.A comprehensive DOE was undertaken to characterize tombstoning of 0201 components in different metallurgical solder systems. Factors included pad geometry, board finish, stencil geometry, solder paste type, print and placement offsets, and reflow profile and atmosphere. The experiment was divided into two phases; the results of Phase II are analyzed and reviewed in this document.
机译:墓碑现象是芯片组件在回流周期中一端竖立的现象,在锡铅系统中已得到充分证明和理解。据报道,它在无铅系统中的发生频率更高,并且较小的组件比较大的组件面临更大的风险。 进行了全面的DOE,以表征不同冶金焊料系统中0201组件的墓碑。这些因素包括焊盘的几何形状,电路板的表面处理,模板的几何形状,焊膏的类型,印刷和放置偏移以及回流曲线和气氛。实验分为两个阶段。本文档对第二阶段的结果进行了分析和审查。

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