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Optical and Electrical Properties of Transparent Conductive ITO Thin Films under Proton Radiation with 100 keV

机译:100 keV质子辐射下透明导电ITO薄膜的光电性能。

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Under the simulation environment for the vacuum and heat sink in space, the changes in optical and electrical properties of transparent conductive indium tin oxide (ITO) thin films induced by radiation of protons with 100 keV were studied. The ITO thin films were deposited on JGSI quartz substrate by a sol-gel method. The sheet resistance and transmittance spectra of the ITO thin films were measured using the four-point probe method and a spectrophotometer, respectively. The surface morphology was analyzed by AFM. The experimental results showed that the electrical and optical performances of the ITO thin films were closely related to the irradiation fluence. When the fluence exceeded a given value 2×10~(16) cm~(-2), the sheet resistance increased obviously and the optical transmittance decreased. The AFM analysis indicated that the grain size of the ITO thin films diminished. The studies about the radiation effect on ITO thin films will help to predict performance evolution of the second surface mirrors on satellites under space radiation environment.
机译:在空间真空和散热器的模拟环境下,研究了质子辐射100 keV引起的透明导电铟锡氧化物(ITO)薄膜的光学和电学性质的变化。通过溶胶-凝胶法将ITO薄膜沉积在JGSI石英基板上。使用四点探针法和分光光度计分别测量ITO薄膜的薄层电阻和透射光谱。通过AFM分析表面形态。实验结果表明,ITO薄膜的电学和光学性能与辐照通量密切相关。当通量超过给定值2×10〜(16)cm〜(-2)时,薄层电阻明显增加,透光率降低。 AFM分析表明ITO薄膜的晶粒尺寸减小。有关ITO薄膜辐射效应的研究将有助于预测空间辐射环境下卫星第二表面镜的性能演变。

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