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A Low Noise 32-Channel CMOS Read-Out Circuit for X-ray Silicon Drift Chamber Detectors

机译:用于X射线硅漂移室检测器的低噪声32通道CMOS读出电路

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In this paper we present a 32-channel integrated front-end circuit for low-energy (0.5-100 keV) X-ray detection with a multi-anode silicon drift detector. The front-end circuit includes 32 read-out pixel cells (RPC), each consisting of a low noise preamplifier, a second-order RC-CR pulse shaper, a peak stretcher, an amplitude and a peak discriminator, as well as a reset and pile-up rejection circuit. Most of the parameters of the front-end circuit are programmable through a digital configuration register, supporting daisy-chain connection. At room temperature the equivalent noise charge of the RPC is 18.3 e~- and its linearity error is lower than 5% over the complete input range. The front-end circuit has been designed in a 0.35-μm CMOS technology with main 3.3-V power supply. A single RPC occupies an area of 200 x 380 μm~2 and consumes 0.4 mW.
机译:在本文中,我们介绍了一种32通道集成前端电路,用于低能量(0.5-100keV)X射线检测,具有多阳极硅漂移检测器。前端电路包括32个读出像素电池(RPC),每个读出像素单元(RPC)包括低噪声前置放大器,二阶RC-CR脉冲整形器,峰值箭头,幅度和峰值鉴别器,以及复位和堆积抑制电路。前端电路的大多数参数通过数字配置寄存器可编程,支持菊花链连接。在室温下,RPC的等效噪声电荷为18.3 e〜 - 并且其线性误差在完整输入范围内低于5%。前端电路设计成0.35微米的CMOS技术,具有主机3.3 V电源。单个RPC占面积200×380μm〜2,消耗0.4 mW。

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