N-detection stuck-at test sets were shown to be effective in achieving high defect coverages for benchmark circuits. However, the definition of n-detection rest sets allows the same set of faults to be detected by several different tests, thus potentially detecting the same defects. We propose an extension of the n-detection model that alleviates this problem by considering m-tuples of faults and requiring that different tests would detect different m-tuples. We present experimental results to support this model.
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