首页>
外国专利>
Detecting single event upsets and stuck-at faults in RAM-based data path controllers
Detecting single event upsets and stuck-at faults in RAM-based data path controllers
展开▼
机译:在基于RAM的数据路径控制器中检测单个事件upsets和陷入困境
展开▼
页面导航
摘要
著录项
相似文献
摘要
In one embodiment, a method includes receiving data comprising a plurality of data elements; creating a binary sequence comprising a plurality of bonus bits using a first binary sequence generator; using a first exclusive-or module to provide a XOR calculation using bits of each data element of the data with a bonus bit from the binary sequence; passing each data element along with its corresponding parity bit to an input of a data path; receiving each data element along with its corresponding parity bit at an output of the data path; creating the binary sequence using a second binary sequence generator; using a second XOR module to XOR together bits of each data element along with its corresponding parity bit and a bonus bit from the binary sequence to produce a resu and analyzing the result to determine whether an error has occurred to the data in the data path.
展开▼