首页> 外文会议>International Conference on Nitride Semiconductors(ICNS-5); 20030525-20030530; Nara; JP >Effects of heavy nitrogen doping in Ⅲ-Ⅴ semiconductors - How well does the conventional wisdom hold for the dilute nitrogen “Ⅲ-Ⅴ-N alloys'?
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Effects of heavy nitrogen doping in Ⅲ-Ⅴ semiconductors - How well does the conventional wisdom hold for the dilute nitrogen “Ⅲ-Ⅴ-N alloys'?

机译:Ⅲ-Ⅴ族半导体中重氮掺杂的影响-稀有氮对“Ⅲ-Ⅴ-N合金”的传统看法如何?

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Although heavily N doped Ⅲ-Ⅴ semiconductors are frequently referred to as dilute nitrogen Ⅲ-Ⅴ-nitride alloys in general, it is important to realize that there are some subtle but important differences among them. In the indirect gap semiconductor GaP, since even a single N impurity can have a bound state, as far as the absorption near the band gap is concerned, it is difficult to describe GaP: N as an alloy. The N induced bound states (a hierarchy of impurity complexes) can in fact give rise to rather strong absorption below the indirect band gap, which effectively reduced the energy of the "absorption edge", but the position of the absorption edge cannot be defined in a conventional way. In the direct gap semiconductor GaAs, a single N impurity does not form a bound state but instead has a resonant state above the conduction band edge. In this aspect, GaAs: N is similar to the situation in a conventional alloy, say, GaAs : P, except that the perturbation of N to the host is much stronger than that of P. However, because in reality N incorporation is typically in a random manner and a cluster as small as one N pair can generate bound states, the permissible region for GaAs: N to behave as a regular alloy is in fact rather limited, i.e., only when the N concentration is low enough so that the N pair and cluster states do not significantly interact with the host. In this study, a precise tracking of the evolution of the host and N induced impurity states will be offered for the two prototype systems, GaAs: N and GaP: N, with x varying from as low as ~10~(-5) to ~10~(-2). Such a study gives valuable insight to the underlying physics of the material evolution, sets up a bench-mark for testing the theoretical modeling of this type of system, and serves to enhance our understanding of the behavior of isoelectronic impurities in semiconductors in general. The dissimilarity between GaP: N and GaAs: N indicates that seeking a unified model for all the isoelectronic doping systems is unrealistic. Our study also indicates that for strongly perturbed systems like GaP: N and GaAs: N, certain materials properties could be less well defined or not uniquely defined, as compared to those in other conventional semiconductor alloys.
机译:尽管通常将重度掺杂N的Ⅲ-Ⅴ半导体通常称为稀氮Ⅲ-Ⅴ-氮化物合金,但重要的是要意识到它们之间存在一些细微但重要的区别。在间接间隙半导体GaP中,由于即使是单一的N杂质也可以具有束缚状态,因此就带隙附近的吸收而言,难以将GaP:N描述为合金。 N个诱导的束缚态(杂质配合物的层次结构)实际上可以在间接带隙以下引起相当强的吸收,这有效地降低了“吸收边”的能量,但是吸收边的位置无法在常规方式。在直接间隙半导体GaAs中,单个N杂质不形成束缚态,而是在导带边缘以上具有共振态。在这方面,GaAs:N与常规合金(例如,GaAs:P)的情况相似,不同之处在于,N对主体的扰动要比P强得多。但是,因为实际上,N的掺入通常在以一种随机的方式并且只有一个N对的簇可以产生束缚态,实际上,GaAs:N表现为规则合金的允许区域是相当有限的,即只有当N浓度足够低时,N对和群集状态与主机之间的交互作用不明显。在这项研究中,将为两个原型系统GaAs:N和GaP:N提供精确跟踪主体和N诱导的杂质态演变的方法,x的变化范围从低至〜10〜(-5)至〜10〜(-2)。此类研究为材料演化的基础物理学提供了宝贵的见识,为测试此类系统的理论模型建立了基准,并有助于加深我们对半导体中等电子杂质行为的理解。 GaP:N和GaAs:N之间的差异表明,为所有等电子掺杂系统寻求统一模型是不现实的。我们的研究还表明,与其他传统的半导体合金相比,对于GaP:N和GaAs:N等强烈扰动的系统,某些材料的性能可能不太明确或没有唯一定义。

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