首页> 外文会议>International Conference on Nitride Semiconductors(ICNS-5); 20030525-20030530; Nara; JP >Control of electron density in InN by Si doping and optical properties of Si-doped InN
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Control of electron density in InN by Si doping and optical properties of Si-doped InN

机译:通过Si掺杂控制InN中的电子密度和Si掺杂InN的光学性质

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We have studied Si-doping profiles of InN films grown by plasma-assisted molecular-beam epitaxy and their photoluminescence (PL) properties. We confirmed experimentally that Si acts as a donor in InN. Undoped and Si-doped InN films with electron densities (n) of 1.6 x 10~(18)- 1.4 x 10~(19) cm~(-3) showed clear n dependences of PL properties. The PL peak shifted to the higher energy side with increasing n, and the PL intensity decreased with increasing n. These were characteristics of degenerated semiconductors with a large density of defects and/or dislocations. The band-gap energy of degenerated InN films with n = 1.6 x 10~(18) - 4.7 x 10~(18) cm~(-3) was estimated to be about 0.6 eV by assuming a nonpara-bolic conduction band and a constant band-renormalization effect. By taking the band-gap shrinkage of about 20 meV due to the conduction-band renormalization into account, we suggest that the band-gap energy of intrinsic InN is 0.6-0.65 eV.
机译:我们已经研究了通过等离子体辅助分子束外延生长的InN薄膜的Si掺杂分布及其光致发光(PL)特性。我们通过实验证实了Si在InN中充当施主。电子密度(n)为1.6 x 10〜(18)-1.4 x 10〜(19)cm〜(-3)的未掺杂和Si掺杂的InN薄膜表现出明显的n依赖于PL特性。 PL峰随着n的增加而移向较高能量一侧,而PL强度随n的增加而降低。这些是具有大量缺陷和/或位错的退化半导体的特征。通过假设非抛物型导带和a = 1.6 x 10〜(18)-4.7 x 10〜(18)cm〜(-3)退化的InN薄膜的带隙能量估计约为0.6 eV。恒定的频带重归一化效果。考虑到导带重新归一化导致的约20 meV的带隙收缩,我们建议本征InN的带隙能量为0.6-0.65 eV。

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