首页> 外文会议>International Conference on Nitride Semiconductors(ICNS-5); 20030525-20030530; Nara; JP >Localized biexcitons in Al_xGa_(1-x)N ternary alloy epitaxial layers
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Localized biexcitons in Al_xGa_(1-x)N ternary alloy epitaxial layers

机译:Al_xGa_(1-x)N三元合金外延层中的局部双激子

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摘要

Excitonic optical properties of Al_xGa_(1-x)N ternary alloy epitaxial layers have been studied by means of pho-toluminescence (PL), time-resolved PL, and PL excitation (PLE) spectroscopy. The luminescence line due to radiative recombination of biexcitons was clearly observed in an Al_(0.08)Ga_(0.92)N epitaxial layer. The PL decay time of excitons and biexcitons was estimated to be 350 and 210 ps, respectively. PLE spectroscopy of biexcitons enabled us to observe a two-photon absorption process of biexcitons. On the basis of the energy separation between exciton resonance and two-photon biexciton resonance, the binding energy of biexcitons in Al_(0.08)Ga_(0.92)N was estimated to be 15 +- 2 meV. This value was approximately 2.5 times as large as the binding energy of biexcitons in GaN. This value was also found to be comparable to the observed energy separation between the exciton luminescence and the biexciton luminescence, which indicated the strong localization of biexcitons.
机译:通过光致发光(PL),时间分辨的PL和PL激发(PLE)光谱研究了Al_xGa_(1-x)N三元合金外延层的激子光学性质。在Al_(0.08)Ga_(0.92)N外延层中清楚地观察到由于双激子的辐射复合引起的发光线。激子和双激子的PL衰减时间估计分别为350和210 ps。双激子的PLE光谱使我们能够观察到双激子的双光子吸收过程。基于激子共振和双光子双激子共振之间的能量分离,Al_(0.08)Ga_(0.92)N中双激子的结合能估计为15±2 meV。该值大约是双激子在GaN中的结合能的2.5倍。还发现该值与观察到的激子发光和双激子发光之间的能量分离相当,这表明了双激子的强定位。

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