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PZT Thin Films by Radio Frequency Magnetron Sputtering

机译:射频磁控溅射PZT薄膜

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摘要

Pb (Zr_x Ti_(1-x)) O_3 (or PZT) thin films have been deposited on [110] LiTaO_3 single crystal substrates by radio frequency magnetron sputtering using a ceramic target with excess PbO. Highly oriented [101] PZT thin films were obtained when the as-deposited thin films were annealed at 650deg C for 60 min in an oxygen ambient, and a well-developed grain structure was formed. The optical properties of these thin films were also studied.
机译:通过使用具有过量PbO的陶瓷靶,通过射频磁控溅射在[110] LiTaO_3单晶衬底上沉积了Pb(Zr_x Ti_(1-x))O_3(或PZT)薄膜。将沉积后的薄膜在氧气环境中于650℃退火60分钟,即可获得高取向[101] PZT薄膜,并形成了发达的晶粒结构。还研究了这些薄膜的光学性质。

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