首页> 外文会议>Conference on Microlithographic Techniques in Integrated Circuit Fabrication II, Nov 28-30, 2000, Singapore >Simulation of resolution enhancement in contact lithography by off-axis illumination
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Simulation of resolution enhancement in contact lithography by off-axis illumination

机译:离轴照明模拟提高接触光刻的分辨率

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摘要

Intensity distribution on the wafer plane in contact printing system under off-axis illumination is derived based on the amplitude analytic expression for Fresnel-Kirchhoff diffraction. Numerical simulations have been done under various conditions. Resolution enhancement effects by off-axis illumination and its application are analyzed.
机译:基于菲涅耳-基尔霍夫衍射的幅值解析表达式,得出了轴外照射下接触印刷系统中晶片平面上的强度分布。在各种条件下都进行了数值模拟。分析了离轴照明的分辨率增强效果及其应用。

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