PROBE CALIBRATION USING TIME DOMAIN GATING AND OFF-BENCH OPTICAL ALIGNMENT

摘要

Probe correction is required to accurately determine the far-field pattern of an antenna from near-field measurements. At Raytheon Primary Standards Laboratory (PSL) in El Segundo, CA, data acquisition hardware, instrument control software, and a mechanical positioning system have been developed and used with an HP Network Analyzer/Receiver system to perform these measurements. Using a three antenna technique, the on-axis gain and polarization parameters of a linearly (or circularly) polarized probe are calibrated. The relative far-field pattern of the probe is then measured utilizing the two nominal, orthogonal polarizations of the source antenna. All measurements are stepped in frequency and use a time domain gating technique. The probe and the source antenna are optically aligned to the interface and unique, kinematic designed interface flanges allow repeatable mounting of the antennas to the test station.